Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination
نویسندگان
چکیده
منابع مشابه
Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration
Calibration of atomic force microscope (AFM) cantilevers is necessary for the measurement of nanonewton and piconewton forces, which are critical to analytical applications of AFM in the analysis of polymer surfaces, biological structures and organic molecules. We have developed a compact and easy-to-use reference artefact for this calibration by bulk micromachining of silicon, which we call a ...
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ژورنال
عنوان ژورنال: Nanoscience and Nanometrology
سال: 2016
ISSN: 2472-3622
DOI: 10.11648/j.nsnm.20160201.12